United States Federal Circuit

The district court's judgment that defendant infringes plaintiff's patent related to inspection equipment for probe cards used to test chips on semiconductor wafers is: 1) reversed in part, as to the judgment of infringement under the doctrine of equivalents; 2) reversed in part, as to the finding of willfulness predicated on that judgment, and vacated as to the corresponding award of enhanced damages; 3) affirmed in part, as to the award of damages for literal infringement; 4) vacated in part, as to the award of attorneys' fees and costs; and 5) affirmed in part, where the district court did not abuse its discretion in finding no laches.

Appellate Information

• Decided 11/04/2013
• Published 11/04/2013

Judges

• MOORE

Court

• United States Federal Circuit

Counsel